Forthcoming Special Issues
Developments in X-ray computed tomography for precision engineering
Long associated with medical imaging, X-ray computed tomography (CT) is proving its worth in industrial applications such as material characterization, defect analysis and dimensional inspection of manufactured components. Since 2005, when the first purpose-built industrial X-ray CT instrument was made commercially available, there have been significant efforts to understand how reliable X-ray CT dimensional measurements are. The emergence of additive manufacturing (AM) further motivates these efforts, as the ability of X-ray CT to non-destructively acquire fully three-dimensional materials data, dimensional and surface measurement data; and detect defects in a single step makes it ideal for inspection of the complex internal structures that are commonly manufactured by AM processes.
Lawrence Livermore National Laboratory, United States of America
University of Nottingham, United Kingdom
Carl Zeiss Industrial Metrology
Special issue information:
With the ultimate objective of achieving dimensional measurement traceability at uncertainties approaching those of tactile coordinate measuring machines (CMMs), a significant volume of research is being conducted by groups around the world, including:
- development of calibration procedures;
- defining performance characterization protocols;
- establishing methods to correct imaging artifacts;
- characterizing influence factors in the CT instruments; and
- building a measurement model to enable model-based uncertainty assessment.
Manuscript submission information:
This special issue of Precision Engineering brings together state-of-the-art research in these and other topics that advance our shared journey to traceable, high accuracy X-ray CT.
We welcome contributions from researchers working in X-ray computed tomography at all levels of precision. Topics of interest include but are not limited to those described above.
Manuscripts can be submitted until September 30, 2022.
Please refer to the Guide for Authors to prepare your manuscript, and select the article type of “VSI: X-ray Computed Tomography” when submitting your manuscript online at the journal’s submission platform (Editorial Manager®). Both the Guide for Authors and the submission portal could be found on the Journal Homepage here: https://www.journals.elsevier.com/precision-engineering.
Learn more about the benefits of publishing in a special issue: https://www.elsevier.com/authors/submit-your-paper/special-issues
Interested in becoming a guest editor? Discover the benefits of guest editing a special issue and the valuable contribution that you can make to your field: https://www.elsevier.com/editors/role-of-an-editor/guest-editors